(DOWNLOAD) "Built-in-Self-Test and Digital Self-Calibration for RF SoCs" by Sleiman Bou-Sleiman & Mohammed Ismail * eBook PDF Kindle ePub Free
eBook details
- Title: Built-in-Self-Test and Digital Self-Calibration for RF SoCs
- Author : Sleiman Bou-Sleiman & Mohammed Ismail
- Release Date : January 23, 2011
- Genre: Electrical Engineering,Books,Professional & Technical,Engineering,
- Pages : * pages
- Size : 1264 KB
Description
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
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